BackForwardInstrument:  SpaceView-110 

Instrument details
Acronym SpaceView-110
Full name SpaceView-110 Imaging System
Purpose Very-high-resolution land imagery
Short description 5-channel VIS/NIR radiometer with one panchromatic channel and 4 multi-spectral. 110-cm telescope [see detailed characteristics below]
Background Evolution of OSA on Ikonos, OHRIS on OrbView-3 and GIS on GeoEye-1
Scanning Technique Pushbroom, swath 13.1 km addressable by tilting the satellite in a variety of operating modes. Stereo capability both along-track and cross-orbits
Resolution 0.31 m (panchromatic), 1.24 m (multi-spectral), at the s.s.p.
Coverage / Cycle Global coverage in 6 months, in daylight; in few days (down to 3) by strategic pointing
Mass 500 kg Power 1000 W Data Rate 800 Mbps

 

Providing Agency DigitalGlobe
Instrument Maturity Flown on an R&D satellite
Utilization Period: 2017 to 2019
Last update: 2021-08-31
Detailed characteristics
Central wavelength Spectral interval SNR @ specified albedo
N/A (PAN) 450 - 800 nm ……….. @ ……… % albedo
480 nm 450 - 510 nm ……….. @ ……… % albedo
545 nm 510 - 580 nm ……….. @ ……… % albedo
672 nm 655 - 690 nm ……….. @ ……… % albedo
850 nm 780 - 920 nm ……….. @ ……… % albedo
Satellites this instrument is flying on

Note: a red tag indicates satellites no longer operational, a green tag indicates operational satellites, a blue tag indicates future satellites

Instrument classification
  • Earth observation instrument
  • Passive optical radiometer or spectrometer
  • High resolution optical imager
WIGOS Subcomponents
  • Subcomponent 1
  • High-resolution multi-spectral VIS/IR imagers
  • High-resolution multi-spectral VIS/IR imager
  • Subcomponent 4
  • GNSS radio occultation (commercial)
  • High-resolution optical observation constellation (commercial)
Mission objectives
Primary mission objectives
  • Biomass
  • Fraction of Absorbed PAR (FAPAR)
  • Fraction of vegetated land
  • Land cover
  • Leaf Area Index (LAI)
  • Normalised Difference Vegetation Index (NDVI)
  • Vegetation type
Evaluation of Measurements