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Instrument details
Acronym
SEM/XRS-EUV
Full name
SEM / X-Ray Sensor - Extreme Ultra-Violet Sensor
Purpose
To measure disk-integrated solar X-ray and EUV fluxes
Short description
Assemblage of two channels in the X-ray ranges 0.05-0.3 nm and 0.1-0.8 nm; and five channels in the EUV ranges around 10 nm, 30 nm, 60 nm, 80 nm and 126 nm [including Fe-XV at 28.4 nm, He-II at 30.4 nm and H-Lyman-alpha at 121.6 nm]
Background
Part of the SEM (Space Environment Monitor) package
Scanning Technique
Sun pointing from GEO
Resolution
N/A (full disk)
Coverage / Cycle
Full solar disk at 2 s intervals (X-ray) and 33 s (EUV)
Mass
Power
Data Rate
Providing Agency
NOAA
Instrument Maturity
Flown on operational programme
Utilization Period:
1974 to 1981-01-21
Last update:
2021-12-16
Detailed characteristics
Satellites this instrument is flying on
Note: a red tag indicates satellites no longer operational, a
green tag indicates operational satellites, a blue tag indicates
future satellites
Instrument classification
Solar and space environment monitors Solar activity monitor
WIGOS Subcomponents
Subcomponent 1 X-ray spectrometer at GEO Subcomponent 2 Solar X-ray spectrometer [from L1, GEO, LEO] Solar EUV spectrometer [from L1, GEO, LEO] Subcomponent 3 X-ray spectrometer [from GEO, HEO, MEO, LEO] EUV spectrometer [from GEO, HEO, MEO, LEO]
Mission objectives
Tentative Evaluation of Measurements
The following list indicates which measurements can typically be
retrieved from this category of instrument. To see a full Gap Analysis by Variable,
click on the respective variable.
Note: table can be sorted by clicking on the column headers
Variable Relevance for measuring this variable Operational limitations Explanation
Solar X-ray flux 3 - high No specific limitation. Few channels, wide dynamic range
Solar EUV flux 1 - primary No specific limitation. Several channels, wide dynamic range
Instrument: SEM/XRS-EUV