BackForwardInstrument:  EIS 

Instrument details
Acronym EIS
Full name EUV Imaging Spectrometer
Purpose To observe the dynamics of the solar corona by measuring velocity fields and other plasma parameters in the corona
Short description Based on a grating spectrometer for ranges 17-21 and 25-29 nm, including Fe-IX at 17.1 nm, Fe-XII at 19.5 nm and Fe-XV at 28.4 nm
Background Part of a package of instruments for solar observation
Scanning Technique Sun pointing from a sunsynchronous dawn-dusk orbit. Corona view included
Resolution 1500 km at Sun surface
Coverage / Cycle Full Sun disk each 10 s
Mass Power Data Rate 40 kbps


Providing Agency JAXA
Instrument Maturity Flown on an R&D satellite
Utilization Period: 2006-12-22 to ≥2021
Last update: 2021-09-29
Detailed characteristics
Satellites this instrument is flying on

Note: a red tag indicates satellites no longer operational, a green tag indicates operational satellites, a blue tag indicates future satellites

Instrument classification
  • Solar and space environment monitors
  • Solar activity monitor
WIGOS Subcomponents
  • Subcomponent 2
  • Solar EUV spectrometer [from L1, GEO, LEO]
  • Solar EUV imager [from L1, GEO, LEO]
  • Solar coronographic imager [from L1, GEO, LEO]
Mission objectives
Primary mission objectives
  • Solar EUV flux spectrum
  • Solar EUV image
Opportunity objectives
  • Solar coronagraphic image
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Tentative Evaluation of Measurements

The following list indicates which measurements can typically be retrieved from this category of instrument. To see a full Gap Analysis by Variable, click on the respective variable.

Note: table can be sorted by clicking on the column headers
VariableRelevance for measuring this variableOperational limitationsExplanation
Solar EUV flux spectrum2 - very highNo specific limitation.High spectral resolution, moderate dynamic range, solar disc and corona view included
Solar EUV image1 - primaryNo specific limitation.Spectrometry with high spatial resolution, corona view included
Solar coronagraphic image3 - highNo specific limitation.EUV (10-121.6 nm), observed with occultation